Tech@ZWO Yes, but the backlash of the EAF will affect the focus.
No, not if you always establish the reference EAF step position each time before moving by the target offset.
For example, if you start autofocusing with a high EAF position, move it down by an amount larger than the worse case backlash. Call this reference count N, and moving the count downwards monotonically, like the ASIAIR autofocus method to avoid backlash.
When later you need to move by an offset that is larger than the current focus position, you first move the EAF to a position (again, greater than the backlash) that is above N, then move down to the reference N reference position. After that, moving downwards monotonically until you reach the target offset.
There is nothing magical about N, all it does is to establish a location that you need to first position the EAF above, so that all backlash is cleared by the time you start again at N.
Just test this with a shaft encoder like this that can measure the EAF shaft angle and you will see:
https://bbs.astronomy-imaging-camera.com/d/12562-5v-eaf-linearity-and-backlash
Chen